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- catalog contributor b13190190.
- catalog contributor b13190191.
- catalog contributor b13190192.
- catalog contributor b13190193.
- catalog created "c2004.".
- catalog date "2004".
- catalog date "c2004.".
- catalog dateCopyrighted "c2004.".
- catalog description "Includes bibliographical references and author index.".
- catalog extent "xxxi, 518 p. :".
- catalog identifier "0819451363".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 5252.".
- catalog isPartOf "SPIE proceedings series, 0277-786X ; v. 5252".
- catalog issued "2004".
- catalog issued "c2004.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash., USA : SPIE,".
- catalog subject "Metrology Congresses.".
- catalog subject "Optical instruments Design and construction Congresses.".
- catalog subject "Optical instruments Testing Congresses.".
- catalog subject "Optical materials Congresses.".
- catalog subject "TS510 .O586 2004".
- catalog title "Optical fabrication, testing and metrology : 30 September-3 October 2003 / Roland Geyl, David Rimmer, Lingli Wang, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- catalog type "text".