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- catalog abstract "Because of the rapid increase in commercially available Fourier transform infrared spectrometers and computers over the past ten years, it has now become feasible to use IR spectrometry to characterize very thin films at extended interfaces. At the same time, interest in thin films has grown tremendously because of applications in microelectronics, sensors, catalysis, and nanotechnology. The Handbook of Infrared Spectroscopy of Ultrathin Films provides a practical guide to experimental methods, up-to-date theory, and considerable reference data, critical for scientists who want to measure and.".
- catalog contributor b13287114.
- catalog contributor b13287115.
- catalog contributor b13287116.
- catalog created "c2003.".
- catalog date "2003".
- catalog date "c2003.".
- catalog dateCopyrighted "c2003.".
- catalog description "1. Absorption and Reflection of Infrared Radiation by Ultrathin Films -- 2. Optimum Conditions for Recording Infrared Spectra of Ultrathin Films -- 3. Interpretation of IR Spectra of Ultrathin Films -- 4. Equipment and Techniques -- 5. Infrared Spectroscopy of Thin Layers in Silicon Microelectronics -- 6. Application of Infrared Spectroscopy to Analysis of Interfaces and Thin Dielectric Layers in Semiconductor Technology -- 7. Ultrathin Films at Gas-Solid, Gas-Liquid, and Solid-Liquid Interfaces.".
- catalog description "Because of the rapid increase in commercially available Fourier transform infrared spectrometers and computers over the past ten years, it has now become feasible to use IR spectrometry to characterize very thin films at extended interfaces. At the same time, interest in thin films has grown tremendously because of applications in microelectronics, sensors, catalysis, and nanotechnology. The Handbook of Infrared Spectroscopy of Ultrathin Films provides a practical guide to experimental methods, up-to-date theory, and considerable reference data, critical for scientists who want to measure and.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xxiv, 710 p. :".
- catalog hasFormat "Handbook of infrared spectroscopy of ultrathin films.".
- catalog identifier "047135404X (alk. paper)".
- catalog isFormatOf "Handbook of infrared spectroscopy of ultrathin films.".
- catalog issued "2003".
- catalog issued "c2003.".
- catalog language "eng".
- catalog publisher "Hoboken, N.J. : Wiley-Interscience,".
- catalog relation "Handbook of infrared spectroscopy of ultrathin films.".
- catalog subject "621.3815/2 21".
- catalog subject "Infrared spectroscopy.".
- catalog subject "QC176.84.O7 T65 2003".
- catalog subject "Thin films Optical properties.".
- catalog tableOfContents "1. Absorption and Reflection of Infrared Radiation by Ultrathin Films -- 2. Optimum Conditions for Recording Infrared Spectra of Ultrathin Films -- 3. Interpretation of IR Spectra of Ultrathin Films -- 4. Equipment and Techniques -- 5. Infrared Spectroscopy of Thin Layers in Silicon Microelectronics -- 6. Application of Infrared Spectroscopy to Analysis of Interfaces and Thin Dielectric Layers in Semiconductor Technology -- 7. Ultrathin Films at Gas-Solid, Gas-Liquid, and Solid-Liquid Interfaces.".
- catalog title "Handbook of infrared spectroscopy of ultrathin films / Valeri P. Tolstoy, Irina V. Chernyshova, Valeri A. Skryshevsky.".
- catalog type "text".