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- 00037716 contributor B29010.
- 00037716 contributor B29011.
- 00037716 created "2001.".
- 00037716 date "2001".
- 00037716 date "2001.".
- 00037716 dateCopyrighted "2001.".
- 00037716 description "Includes bibliographical references (p. [236]-237) and index.".
- 00037716 extent "x, 251 p. :".
- 00037716 identifier "0748409688 (pbk.)".
- 00037716 identifier 00037716-d.html.
- 00037716 issued "2001".
- 00037716 issued "2001.".
- 00037716 language "eng".
- 00037716 publisher "London ; New York : Taylor & Francis,".
- 00037716 subject "502/.8/25 21".
- 00037716 subject "Electron microscopy.".
- 00037716 subject "QH212.E4 G62 2001".
- 00037716 title "Electron microscopy and analysis / Peter J. Goodhew, John Humphreys, Richard Beanland.".
- 00037716 type "text".