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- 00043683 contributor B35976.
- 00043683 created "2000.".
- 00043683 date "2000".
- 00043683 date "2000.".
- 00043683 dateCopyrighted "2000.".
- 00043683 description "Includes bibliographical references and index.".
- 00043683 extent "xv, 269 p. :".
- 00043683 identifier "047149240X".
- 00043683 identifier 00043683.html.
- 00043683 identifier 00043683.html.
- 00043683 issued "2000".
- 00043683 issued "2000.".
- 00043683 language "eng".
- 00043683 publisher "Chichester, [England] ; New York : Wiley,".
- 00043683 subject "621.3815/2 21".
- 00043683 subject "Photon emission.".
- 00043683 subject "Semiconductors Failures.".
- 00043683 subject "Semiconductors Microscopy.".
- 00043683 subject "Semiconductors Testing.".
- 00043683 subject "TK7871.852 .C47 2000".
- 00043683 title "Semiconductor device and failure analysis : using photon emission microscopy / Wai Kin Chim.".
- 00043683 type "text".