Matches in Library of Congress for { <http://lccn.loc.gov/00046212> ?p ?o. }
Showing items 1 to 23 of
23
with 100 items per page.
- 00046212 contributor B39023.
- 00046212 contributor B39024.
- 00046212 created "c2000.".
- 00046212 date "2000".
- 00046212 date "c2000.".
- 00046212 dateCopyrighted "c2000.".
- 00046212 description "Includes bibliographical references (p. [631]-670) and index.".
- 00046212 extent "xviii, 690 p. :".
- 00046212 identifier "0792379918 (alk. paper)".
- 00046212 identifier 00046212-t.html.
- 00046212 isPartOf "Frontiers in electronic testing ; 17".
- 00046212 issued "2000".
- 00046212 issued "c2000.".
- 00046212 language "eng".
- 00046212 publisher "Boston : Kluwer Academic,".
- 00046212 subject "621.39/5 21".
- 00046212 subject "Digital integrated circuits Testing.".
- 00046212 subject "Integrated circuits Very large scale integration Testing.".
- 00046212 subject "Mixed signal circuits Testing.".
- 00046212 subject "Semiconductor storage devices Testing.".
- 00046212 subject "TK7874.75 .B87 2000".
- 00046212 title "Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits / Michael L. Bushnell, Vishwani D. Agrawal.".
- 00046212 type "text".