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- 00058756 contributor B53353.
- 00058756 created "c2000.".
- 00058756 date "2000".
- 00058756 date "c2000.".
- 00058756 dateCopyrighted "c2000.".
- 00058756 description "Includes bibliographical references and index.".
- 00058756 extent "xvi, 339 p. :".
- 00058756 identifier "030646487X".
- 00058756 issued "2000".
- 00058756 issued "c2000.".
- 00058756 language "eng".
- 00058756 publisher "New York : Kluwer Academic,".
- 00058756 subject "620.1/1299 21".
- 00058756 subject "Crystallography.".
- 00058756 subject "Materials Microscopy.".
- 00058756 subject "Scanning electron microscopy.".
- 00058756 subject "TA417.23 .E419 2000".
- 00058756 title "Electron backscatter diffraction in materials science / edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams.".
- 00058756 type "text".