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- 00102862 alternative "Digest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000".
- 00102862 contributor B69051.
- 00102862 contributor B69052.
- 00102862 contributor B69053.
- 00102862 contributor B69054.
- 00102862 created "c2000.".
- 00102862 date "2000".
- 00102862 date "c2000.".
- 00102862 dateCopyrighted "c2000.".
- 00102862 description "Includes bibliographical references and index.".
- 00102862 extent "ix, 82 p. :".
- 00102862 identifier "0769506372".
- 00102862 issued "2000".
- 00102862 issued "c2000.".
- 00102862 language "eng".
- 00102862 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 00102862 subject "621.3815 22".
- 00102862 subject "Iddq testing Congresses.".
- 00102862 subject "Integrated circuits Defects Congresses.".
- 00102862 subject "Metal oxide semiconductors, Complementary Congresses.".
- 00102862 subject "TK7874 .I326 2000".
- 00102862 title "2000 IEEE International Workshop on Defect Based Testing : April 30, 2000, Montreal, Canada : proceedings / sponsored by IEEE Computer Society Test Technology Technical Committee ; edited by Yashwant K. Malaiya, Manoj Sachdev, Sankaran M. Menon.".
- 00102862 title "Digest of papers, IEEE International Workshop on Defect Based Testing, DBT 2000".
- 00102862 type "text".