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- 00111492 contributor B75457.
- 00111492 contributor B75458.
- 00111492 created "c2001.".
- 00111492 date "2001".
- 00111492 date "c2001.".
- 00111492 dateCopyrighted "c2001.".
- 00111492 description "Includes bibliographic references.".
- 00111492 extent "vi, 67 p. :".
- 00111492 hasFormat "Also available via the World Wide Web.".
- 00111492 identifier "0780366883 (softbound)".
- 00111492 isFormatOf "Also available via the World Wide Web.".
- 00111492 issued "2001".
- 00111492 issued "c2001.".
- 00111492 language "eng".
- 00111492 publisher "Piscataway, N.J. : IEEE,".
- 00111492 relation "Also available via the World Wide Web.".
- 00111492 subject "Semiconductors Characterization Statistical methods Congresses.".
- 00111492 subject "Semiconductors Measurement Congresses.".
- 00111492 subject "TK7871.85 .I58443 2001".
- 00111492 title "2001 6th International Workshop on Statistical Methodology : IWSM : June 10, 2001/Kyoto / technical co-sponsored by IEEE Electron Devices Society ... [et al.].".
- 00111492 type "text".