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- 00266009 contributor B81656.
- 00266009 contributor B81657.
- 00266009 created "c1999.".
- 00266009 date "1999".
- 00266009 date "c1999.".
- 00266009 dateCopyrighted "c1999.".
- 00266009 description "Includes bibliographic references and author index.".
- 00266009 extent "vii, 252 p. :".
- 00266009 identifier "0819434299".
- 00266009 isPartOf "Proceedings of SPIE ; v. 3836".
- 00266009 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3836.".
- 00266009 issued "1999".
- 00266009 issued "c1999.".
- 00266009 language "eng".
- 00266009 publisher "Bellingham, Wash., USA : SPIE,".
- 00266009 subject "670.42/5 21".
- 00266009 subject "Computer vision Congresses.".
- 00266009 subject "Computer vision Industrial applications Congresses.".
- 00266009 subject "Engineering inspection Automation Congresses.".
- 00266009 subject "Optical measurements Congresses.".
- 00266009 subject "TA1634 .M3356 1999".
- 00266009 title "Machine vision systems for inspection and metrology VIII : 21-22 September 1999, Boston, Massachusetts / John W.V. Miller, Susan Snell Solomon, Bruce G. Batchelor, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- 00266009 type "text".