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- 00266150 contributor B81816.
- 00266150 created "c1999.".
- 00266150 date "1999".
- 00266150 date "c1999.".
- 00266150 dateCopyrighted "c1999.".
- 00266150 description "Includes bibliographical references and index.".
- 00266150 description "X-ray diffraction / Robert L. Snyder -- Application of synchrotron X-radiation to problems in materials science / Andrea R. Gerson ... [et al.] -- X-ray fluorescence analysis / Ronald Jenkins -- Small-angle scattering of x-rays and neutrons / Claudine E. Williams, Roland P. May, and André Guinier.".
- 00266150 extent "xvi, 261 p. :".
- 00266150 identifier "3527296573".
- 00266150 identifier 00266150.html.
- 00266150 identifier 00266150.html.
- 00266150 issued "1999".
- 00266150 issued "c1999.".
- 00266150 language "eng".
- 00266150 publisher "Weinheim ; New York : Wiley-VCH,".
- 00266150 subject "620.1/1272 21".
- 00266150 subject "Materials Analysis.".
- 00266150 subject "Surfaces (Technology) Analysis.".
- 00266150 subject "TA417.25 .X69 1999".
- 00266150 subject "X-rays Industrial applications.".
- 00266150 tableOfContents "X-ray diffraction / Robert L. Snyder -- Application of synchrotron X-radiation to problems in materials science / Andrea R. Gerson ... [et al.] -- X-ray fluorescence analysis / Ronald Jenkins -- Small-angle scattering of x-rays and neutrons / Claudine E. Williams, Roland P. May, and André Guinier.".
- 00266150 title "X-ray characterization of materials / Eric Lifshin (ed.).".
- 00266150 type "text".