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- 00269224 contributor B85561.
- 00269224 contributor B85562.
- 00269224 created "c1999.".
- 00269224 date "1999".
- 00269224 date "c1999.".
- 00269224 dateCopyrighted "c1999.".
- 00269224 description "Includes bibliographic references and author index.".
- 00269224 extent "ix, 394 p. :".
- 00269224 identifier "0819433101".
- 00269224 isPartOf "Proceedings / SPIE--the International Society for Optical Engineering ; v. 3824".
- 00269224 isPartOf "Proceedings EurOpt series".
- 00269224 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3824.".
- 00269224 issued "1999".
- 00269224 issued "c1999.".
- 00269224 language "eng".
- 00269224 publisher "Bellingham, Washington : SPIE,".
- 00269224 subject "670.42/5 21".
- 00269224 subject "Engineering inspection Congresses.".
- 00269224 subject "Optical detectors Industrial applications Congresses.".
- 00269224 subject "Optical instruments Industrial applications Congresses.".
- 00269224 subject "Quality control Optical methods Congresses.".
- 00269224 subject "TS156.2 .O653 1999".
- 00269224 title "Optical measurement systems for industrial inspection : 16-17 June, 1999, Munich, Germany / Małgorzata Kujawińska, Wolfgang Osten, chairs/editors ; sponsored by EOS--European Optical Society ... [et al.] ; published by SPIE--the International Society for Optical Engineering.".
- 00269224 type "text".