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- 00308928 contributor B124726.
- 00308928 created "1999.".
- 00308928 date "1999".
- 00308928 date "1999.".
- 00308928 dateCopyrighted "1999.".
- 00308928 description "Includes bibliographical references (p. 143-151).".
- 00308928 description "Originally presented as the author's thesis (Swiss Federal Institute of Technology), Diss. ETH No. 13274.".
- 00308928 extent "viii, 159 p. :".
- 00308928 isPartOf "Series in microelectronics, 0936-5362 ; v. 88".
- 00308928 issued "1999".
- 00308928 issued "1999.".
- 00308928 language "Summary in German.".
- 00308928 language "eng ger".
- 00308928 language "eng".
- 00308928 publisher "Konstanz : Hartung-Gorre,".
- 00308928 subject "621.3815/2 22".
- 00308928 subject "Metal oxide semiconductors.".
- 00308928 subject "Semiconductors Failures.".
- 00308928 subject "TK7871.99.M44 P48 1999".
- 00308928 title "Characterisation of degradation and failure phenomena in MOS devices / Paul Pfäffli.".
- 00308928 type "text".