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- 00689208 contributor B274938.
- 00689208 contributor B274939.
- 00689208 created "c1999.".
- 00689208 date "1999".
- 00689208 date "c1999.".
- 00689208 dateCopyrighted "c1999.".
- 00689208 description "Includes bibliographical references and index.".
- 00689208 extent "vii, 404 p. :".
- 00689208 identifier "0819432709".
- 00689208 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3784.".
- 00689208 isPartOf "SPIE proceedings series ; v. 3784".
- 00689208 issued "1999".
- 00689208 issued "c1999.".
- 00689208 language "eng".
- 00689208 publisher "Bellingham, Wash., USA : SPIE,".
- 00689208 subject "620/.44 21".
- 00689208 subject "Scattering (Physics) Congresses.".
- 00689208 subject "Surface contamination Congresses.".
- 00689208 subject "Surface roughness Measurement Congresses.".
- 00689208 subject "TA418.7 .R6697 1999".
- 00689208 title "Rough surface scattering and contamination : 21-23 July 1999, Denver, Colorado / Philip T. C. Chen, Zu-Han Gu, Alexei A. Maradudin, chairs/editors ; sponsored ... by SPIE--The International Society for Optical Engineering.".
- 00689208 type "text".