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- 00698331 contributor B284576.
- 00698331 contributor B284577.
- 00698331 created "c1999.".
- 00698331 date "1999".
- 00698331 date "c1999.".
- 00698331 dateCopyrighted "c1999.".
- 00698331 description "Includes bibliographical references and index.".
- 00698331 extent "v, 182 p. :".
- 00698331 identifier "081943292X".
- 00698331 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3806.".
- 00698331 isPartOf "SPIE proceedings series ; v. 3806".
- 00698331 issued "1999".
- 00698331 issued "c1999.".
- 00698331 language "eng".
- 00698331 publisher "Bellingham, Wash., USA : SPIE,".
- 00698331 subject "621.39/767 21".
- 00698331 subject "Optical disks Standards Congresses.".
- 00698331 subject "Optical disks Testing Congresses.".
- 00698331 subject "Optical storage devices Testing Congresses.".
- 00698331 subject "TA1635 .R43 1999".
- 00698331 title "Recent advances in metrology, characterization, and standards for optical digital data disks : 21-22 July 1999, Denver, Colorado / sponsored by SPIE--the International Society for Optical Engineering, IDEMA, [and] Information Technology Lab./National Institute of Standards and Technology ; [Fernando Luis Podio, chair/editor].".
- 00698331 type "text".