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- 00703275 alternative "1999 IEEE International Test Conference".
- 00703275 alternative "IEEE International Test Conference".
- 00703275 alternative "International Test Conference 1999".
- 00703275 alternative "International Test Conference".
- 00703275 alternative "Proceedings : International Test Conference 1999".
- 00703275 contributor B288435.
- 00703275 contributor B288436.
- 00703275 created "c1999.".
- 00703275 date "1999".
- 00703275 date "c1999.".
- 00703275 dateCopyrighted "c1999.".
- 00703275 description "Includes bibliographical references and index.".
- 00703275 extent "xiv, 1163 p. :".
- 00703275 identifier "0780357531 (softbound)".
- 00703275 identifier "078035754X (casebound)".
- 00703275 identifier "0780357558 (microfiche)".
- 00703275 issued "1999".
- 00703275 issued "c1999.".
- 00703275 language "eng".
- 00703275 publisher "Washington, D.C. : International Test Conference ; Piscataway, NJ : IEEE Service Center,".
- 00703275 subject "621.3815/48 21".
- 00703275 subject "Electronic digital computers Circuits Testing Congresses.".
- 00703275 subject "Embedded computer systems Testing Congresses.".
- 00703275 subject "Integrated circuits Testing Congresses.".
- 00703275 subject "Microprocessors Testing Congresses.".
- 00703275 subject "TK7874 .I593 1999".
- 00703275 title "1999 IEEE International Test Conference".
- 00703275 title "IEEE International Test Conference".
- 00703275 title "International Test Conference 1999".
- 00703275 title "International Test Conference".
- 00703275 title "Proceedings : International Test Conference 1999".
- 00703275 title "Proceedings, International Test Conference 1999".
- 00703275 type "text".