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- 00708761 alternative "ETW 2000".
- 00708761 contributor B289575.
- 00708761 contributor B289576.
- 00708761 created "c2000.".
- 00708761 date "2000".
- 00708761 date "c2000.".
- 00708761 dateCopyrighted "c2000.".
- 00708761 description "Includes bibliographic references and index.".
- 00708761 extent "[xvi], 181 p. :".
- 00708761 identifier "0769507018".
- 00708761 identifier "0769507026 (case)".
- 00708761 identifier "0769507034 (microfiche)".
- 00708761 issued "2000".
- 00708761 issued "c2000.".
- 00708761 language "eng".
- 00708761 publisher "Los Alamitos, California : IEEE Computer Society Press,".
- 00708761 subject "621.3815/48 21".
- 00708761 subject "Integrated circuits Testing Congresses.".
- 00708761 subject "TK7874 .I3228 2000".
- 00708761 title "ETW 2000".
- 00708761 title "IEEE European Test Workshop : proceedings : 23-26 May, 2000, Cascais, Portugal / sponsored by, IEEE Computer Society Test Technology Technical Council (TTTC) ; in cooperation with, Electrical and Computer Engineering Department, Lisbon Technical University ; organized by, INESC.".
- 00708761 type "text".