Matches in Library of Congress for { <http://lccn.loc.gov/00708945> ?p ?o. }
Showing items 1 to 24 of
24
with 100 items per page.
- 00708945 contributor B289814.
- 00708945 created "c1999.".
- 00708945 date "1999".
- 00708945 date "c1999.".
- 00708945 dateCopyrighted "c1999.".
- 00708945 description "Includes bibliographical references and index.".
- 00708945 extent "v, 186 p. :".
- 00708945 identifier "081943311X".
- 00708945 isPartOf "Proceedings EurOpt series".
- 00708945 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3825.".
- 00708945 isPartOf "SPIE proceedings series, 0277-786X ; v. 3825".
- 00708945 issued "1999".
- 00708945 issued "c1999.".
- 00708945 language "eng".
- 00708945 publisher "Bellingham, Wash., USA : SPIE,".
- 00708945 subject "621.381 21".
- 00708945 subject "Interferometry Congresses.".
- 00708945 subject "Measurement Congresses.".
- 00708945 subject "Microelectromechanical systems Congresses.".
- 00708945 subject "Microelectronics Congresses.".
- 00708945 subject "Optical instruments Industrial applications Congresses.".
- 00708945 subject "TK7874 .M48925 1999".
- 00708945 title "Microsystems metrology and inspection : 15-16 June 1999, Munich, Germany / Christophe Gorecki, chair/editor ; sponsored by EOS--European Optical Society ... [et al.].".
- 00708945 type "text".