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- 00710602 contributor B291439.
- 00710602 contributor B291440.
- 00710602 created "c2000.".
- 00710602 date "2000".
- 00710602 date "c2000.".
- 00710602 dateCopyrighted "c2000.".
- 00710602 description "Includes bibliographical references and index.".
- 00710602 extent "xxviii, 498 p. :".
- 00710602 identifier "0750306858".
- 00710602 identifier 00710602-d.html.
- 00710602 isPartOf "Institute of Physics conference series ; no. 165".
- 00710602 issued "2000".
- 00710602 issued "c2000.".
- 00710602 language "eng".
- 00710602 publisher "Bristol ; Philadelphia : Institute of Physics Publishing,".
- 00710602 subject "545/.842 21".
- 00710602 subject "Electron probe microanalysis Congresses.".
- 00710602 subject "Microprobe analysis Congresses.".
- 00710602 subject "Micrurgy Congresses.".
- 00710602 subject "QD117.E42 I58 2000".
- 00710602 subject "Spectrum analysis Congresses.".
- 00710602 title "Microbeam analysis 2000 : proceedings of the Second Conference of the International Union of Microbeam Analysis Societies held in Kailua-Kona, Hawaii, 9-14 July 2000 / edited by David B Williams and Ryuichi Shimizu ; edited by David B Williams and Ryuichi Shimizu.".
- 00710602 type "text".