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- 00711172 contributor B292121.
- 00711172 contributor B292122.
- 00711172 created "c1998.".
- 00711172 date "1998".
- 00711172 date "c1998.".
- 00711172 dateCopyrighted "c1998.".
- 00711172 description "Includes bibliographic references and author index.".
- 00711172 extent "xiv, 152 p. :".
- 00711172 identifier "0819436445".
- 00711172 isPartOf "Proceedings of SPIE ; v. 4018".
- 00711172 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4018.".
- 00711172 isPartOf "SPIE Poland Chapter proceedings ; 52".
- 00711172 issued "1998".
- 00711172 issued "c1998.".
- 00711172 language "eng".
- 00711172 publisher "Bellingham, Wash., USA : SPIE,".
- 00711172 subject "681/.25 21".
- 00711172 subject "Laser beams Measurement Congresses.".
- 00711172 subject "Optical measurements Congresses.".
- 00711172 subject "Optoelectronics Congresses.".
- 00711172 subject "TA1750 .O585 1998".
- 00711172 title "Optoelectronic metrology : 28-30 September, 1998, Łańcut, Poland / Jan Owsik, Tomasz Wie̜cek, editors ; Wojciech Skrzeczanowski, Ewa Burdziakowska, co-editors ; organized by Institute of Optoelectronics, Military University of Technology, Warsaw (Poland), Central Office of Measures, Warsaw (Poland), [and] Foundation for Industrial and Environmental Science, Rzeszów (Poland) ; sponsored by Committee of Scientific Research (Poland) [and] SPIE Poland Chapter.".
- 00711172 type "text".