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- 2001053158 contributor B8959021.
- 2001053158 created "c2003.".
- 2001053158 date "2003".
- 2001053158 date "c2003.".
- 2001053158 dateCopyrighted "c2003.".
- 2001053158 description "Includes bibliographical references and index.".
- 2001053158 extent "xiv, 715 p. :".
- 2001053158 identifier "1560329416 (alk. paper)".
- 2001053158 identifier 2001053158-d.html.
- 2001053158 isPartOf "Optoelectronic properties of semiconductors and superlattices ; v. 17".
- 2001053158 issued "2003".
- 2001053158 issued "c2003.".
- 2001053158 language "eng".
- 2001053158 publisher "New York : Taylor & Francis,".
- 2001053158 subject "537.6/226 21".
- 2001053158 subject "Microprobe analysis.".
- 2001053158 subject "QC611.6.O6 M52 2003".
- 2001053158 subject "Semiconductors Optical properties.".
- 2001053158 title "Microprobe characterization of optoelectronic materials / edited by Juan Jiménez.".
- 2001053158 type "text".