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- 2001091142 contributor B8969689.
- 2001091142 contributor B8969690.
- 2001091142 created "2001.".
- 2001091142 date "2001".
- 2001091142 date "2001.".
- 2001091142 dateCopyrighted "2001.".
- 2001091142 description "Includes bibliographical references and index.".
- 2001091142 extent "xiv, 304 p. :".
- 2001091142 identifier "0735400113".
- 2001091142 identifier 2001091142-d.html.
- 2001091142 isPartOf "AIP conference proceedings ; no. 572.".
- 2001091142 isPartOf "AIP conference proceedings, 0094-243X ; v. 572".
- 2001091142 issued "2001".
- 2001091142 issued "2001.".
- 2001091142 language "eng".
- 2001091142 publisher "Melville, N.Y. : American Institute of Physics,".
- 2001091142 subject "539.7/3 21".
- 2001091142 subject "Electron beams Congresses.".
- 2001091142 subject "Ion sources Congresses.".
- 2001091142 subject "QC702.3 .I6 2000".
- 2001091142 title "Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 / editor, Krsto Prelec.".
- 2001091142 type "text".