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- 2001092045 alternative "DECON 2001".
- 2001092045 contributor B8970301.
- 2001092045 contributor B8970302.
- 2001092045 created "c2001.".
- 2001092045 date "2001".
- 2001092045 date "c2001.".
- 2001092045 dateCopyrighted "c2001.".
- 2001092045 description "Includes bibliographical references.".
- 2001092045 extent "x, 362 p. :".
- 2001092045 identifier "1566773636".
- 2001092045 isPartOf "Proceedings (Electrochemical Society) ; v. 2001-29.".
- 2001092045 isPartOf "Proceedings ; 2001-29".
- 2001092045 issued "2001".
- 2001092045 issued "c2001.".
- 2001092045 language "eng".
- 2001092045 publisher "Pennington, NJ : Electrochemical Society,".
- 2001092045 subject "621.39/5 22".
- 2001092045 subject "Crystals Defects Congresses.".
- 2001092045 subject "Integrated circuits Very large scale integration Congresses.".
- 2001092045 subject "TK7874.75 .D43 2001".
- 2001092045 title "Cystalline defects and contamination : their impact and and control in device manufacturing III : DECON 2001 : proceedings of the satellite symposium to ESSDERC 2001, Nuremberg, Germany / editors, B.O. Kolbesen ... [et al.].".
- 2001092045 title "DECON 2001".
- 2001092045 type "text".