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- 2001267596 contributor B8983321.
- 2001267596 contributor B8983322.
- 2001267596 created "2000.".
- 2001267596 date "2000".
- 2001267596 date "2000.".
- 2001267596 dateCopyrighted "2000.".
- 2001267596 description "Includes bibliographical references and index.".
- 2001267596 extent "ix, 246 p. :".
- 2001267596 identifier "0819435384".
- 2001267596 isPartOf "Proceedings of SPIE ; 0277-786X v. 3922".
- 2001267596 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3922.".
- 2001267596 isPartOf "Progress in biomedical optics and imaging ; v. 1, no. 16".
- 2001267596 issued "2000".
- 2001267596 issued "2000.".
- 2001267596 language "eng".
- 2001267596 publisher "Bellingham, Wash., USA : SPIE,".
- 2001267596 subject "610/.28 21".
- 2001267596 subject "Medical electronics Congresses.".
- 2001267596 subject "Nanotechnology Congresses.".
- 2001267596 subject "R856.A2 S28 2000".
- 2001267596 subject "Scanning force microscopy Congresses.".
- 2001267596 subject "Scanning probe microscopy Congresses.".
- 2001267596 title "Scanning and force microscopies for biomedical applications II : 23-24 January 2000, San Jose, California / Shuming Nie, Eiichi Tamiya, Edward S. Yeung, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] IBOS--International Biomedical Optics Society.".
- 2001267596 type "text".