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- 2001267693 contributor B8983488.
- 2001267693 contributor B8983489.
- 2001267693 created "c2000.".
- 2001267693 date "2000".
- 2001267693 date "c2000.".
- 2001267693 dateCopyrighted "c2000.".
- 2001267693 description "Includes bibliographical references and index.".
- 2001267693 extent "ix, 396 p. :".
- 2001267693 identifier "0819435848".
- 2001267693 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 3966.".
- 2001267693 isPartOf "SPIE proceedings series, 0277-786X ; v. 3966".
- 2001267693 issued "2000".
- 2001267693 issued "c2000.".
- 2001267693 language "eng".
- 2001267693 publisher "Bellingham, Wash., USA : SPIE,".
- 2001267693 subject "670.42/5 21".
- 2001267693 subject "Computer vision Industrial applications Congresses.".
- 2001267693 subject "Engineering inspection Automation Congresses.".
- 2001267693 subject "Measurement Congresses.".
- 2001267693 subject "Quality control Optical methods Automation Congresses.".
- 2001267693 subject "TS156.2 .M3255 2000".
- 2001267693 title "Machine vision applications in industrial inspection VIII : 24-26 January 2000, San Jose, California / Kenneth W. Tobin, Jr., chair/editor ; sponsored by IS&T--the Society for Imaging Science and Technology [and] SPIE--the International Society for Optical Engineering.".
- 2001267693 type "text".