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- 2001269009 contributor B8985140.
- 2001269009 contributor B8985141.
- 2001269009 created "c2000.".
- 2001269009 date "2000".
- 2001269009 date "c2000.".
- 2001269009 dateCopyrighted "c2000.".
- 2001269009 description "Includes bibliographical references and index.".
- 2001269009 extent "xxii, 468 p. :".
- 2001269009 identifier "0819438928".
- 2001269009 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4221.".
- 2001269009 isPartOf "SPIE proceedings series ; v. 4221".
- 2001269009 issued "2000".
- 2001269009 issued "c2000.".
- 2001269009 language "eng".
- 2001269009 publisher "Bellingham, Wash. : SPIE,".
- 2001269009 subject "681/.25 21".
- 2001269009 subject "Nondestructive testing Congresses.".
- 2001269009 subject "Optical measurements Congresses.".
- 2001269009 subject "Optoelectronic devices Industrial applications Congresses.".
- 2001269009 subject "QC367 .O57 2000".
- 2001269009 title "Optical measurement and nondestructive testing : techniques and applications : 8-10 November 2000, Beijing, China / FeiJun Song ... [et al.], chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.".
- 2001269009 type "text".