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- 2001269021 contributor B8985162.
- 2001269021 contributor B8985163.
- 2001269021 created "c2000.".
- 2001269021 date "2000".
- 2001269021 date "c2000.".
- 2001269021 dateCopyrighted "c2000.".
- 2001269021 description "Includes bibliographical references and index.".
- 2001269021 extent "xx, 434 p. :".
- 2001269021 identifier "0819438936".
- 2001269021 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4222.".
- 2001269021 isPartOf "SPIE proceedings series ; v. 4222".
- 2001269021 issued "2000".
- 2001269021 issued "c2000.".
- 2001269021 language "eng".
- 2001269021 publisher "Bellingham, Wash., USA : SPIE,".
- 2001269021 subject "670.42/5 21".
- 2001269021 subject "Detectors Industrial applications Congresses.".
- 2001269021 subject "Manufacturing processes Automation Congresses.".
- 2001269021 subject "Process control Automation Congresses.".
- 2001269021 subject "TS156.8 .P743 2000".
- 2001269021 title "Process control and inspection for industry : 8-10 November 2000, Beijing, China / Shulian Zhang, Wei Gao, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, CPS--Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.".
- 2001269021 type "text".