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- 2001270775 alternative "Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.".
- 2001270775 alternative "Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000".
- 2001270775 contributor B8987399.
- 2001270775 contributor B8987400.
- 2001270775 contributor B8987401.
- 2001270775 created "c2000.".
- 2001270775 date "2000".
- 2001270775 date "c2000.".
- 2001270775 dateCopyrighted "c2000.".
- 2001270775 description "Includes bibliographical references and author index.".
- 2001270775 extent "x, 131 p. :".
- 2001270775 hasFormat "Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.".
- 2001270775 identifier "0769506895".
- 2001270775 identifier "0769506909 (case)".
- 2001270775 identifier "0769506917 (microfiche)".
- 2001270775 identifier RecentCon.htm?punumber=6973.
- 2001270775 isFormatOf "Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.".
- 2001270775 issued "2000".
- 2001270775 issued "c2000.".
- 2001270775 language "eng".
- 2001270775 publisher "Los Alamitos, Calif. : IEEE Computer Society,".
- 2001270775 relation "Also available via the World Wide Web with additional title: Memory Technology, Design and Testing, 2000, records of the 2000 IEEE International Workshop on.".
- 2001270775 subject "621.39/732 21".
- 2001270775 subject "Random access memory Congresses.".
- 2001270775 subject "Semiconductor storage devices Testing Congresses.".
- 2001270775 subject "TK7895.M4 I334 2000".
- 2001270775 title "Records of the 2000 IEEE International Workshop on Memory Technology, Design and Testing : August 7-8, 2000, San Jose, California / edited by R. Rajsuman and T. Wik ; sponsored by IEEE Computer Society, IEEE Computer Society Technical Council on Test Technology, IEEE Computer Society Technical Committee on VLSI ; in cooperation with IEEE Solid-State Circuits Society.".
- 2001270775 title "Records of the IEEE International Workshop on Memory Technology, Design and Testing 2000".
- 2001270775 type "text".