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- 2001273888 contributor B8991279.
- 2001273888 contributor B8991280.
- 2001273888 created "c2000.".
- 2001273888 date "2000".
- 2001273888 date "c2000.".
- 2001273888 dateCopyrighted "c2000.".
- 2001273888 description "Includes bibliographical references and index.".
- 2001273888 extent "xi, 642 p. :".
- 2001273888 identifier "0819439045".
- 2001273888 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4231.".
- 2001273888 isPartOf "SPIE proceedings series ; v. 4231".
- 2001273888 issued "2000".
- 2001273888 issued "c2000.".
- 2001273888 language "eng".
- 2001273888 publisher "Bellingham, Wash., USA : SPIE,".
- 2001273888 subject "681/.4 21".
- 2001273888 subject "Optical industry Congresses.".
- 2001273888 subject "Optical instruments Design and construction Congresses.".
- 2001273888 subject "Optical instruments Industrial applications Congresses.".
- 2001273888 subject "Optical instruments Testing Congresses.".
- 2001273888 subject "TS510 .A385 2000".
- 2001273888 title "Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China / Li Yang ... [et al.], chairs/editors ; sponsored by COS--Chinese Optical Society [and] SPIE--the International Society for Optical Engineering ; cooperating organizations, National Natural Science Foundation of China ... [et al.].".
- 2001273888 type "text".