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- 2001466480 contributor B9165269.
- 2001466480 created "2001.".
- 2001466480 date "2001".
- 2001466480 date "2001.".
- 2001466480 dateCopyrighted "2001.".
- 2001466480 description "Includes bibliographical references (p. 167-175).".
- 2001466480 description "Originally presented as the author's thesis (Swiss Federal Institute of Technology), Diss. ETH No. 13790.".
- 2001466480 extent "x, 178 p. :".
- 2001466480 identifier "3896496573".
- 2001466480 isPartOf "Series in microelectronics, 0936-5362 ; v. 111".
- 2001466480 issued "2001".
- 2001466480 issued "2001.".
- 2001466480 language "Summary in Italian.".
- 2001466480 language "eng ita".
- 2001466480 language "eng".
- 2001466480 publisher "Konstanz : Hartung-Gorre,".
- 2001466480 subject "Insulated gate bipolar transistors Reliability.".
- 2001466480 subject "TK7871.96.B55 C53 2001".
- 2001466480 title "Some reliability aspects of IGBT modules for high-power applications / Mauro Ciappa.".
- 2001466480 type "text".