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- 2002028276 contributor B9221694.
- 2002028276 created "c2003.".
- 2002028276 date "2003".
- 2002028276 date "c2003.".
- 2002028276 dateCopyrighted "c2003.".
- 2002028276 description "Includes bibliographical references and index.".
- 2002028276 extent "xix, 689 p. :".
- 2002028276 identifier "0306472929".
- 2002028276 identifier 2002028276-d.html.
- 2002028276 issued "2003".
- 2002028276 issued "c2003.".
- 2002028276 language "eng".
- 2002028276 publisher "New York : Kluwer Academic/Plenum Publishers,".
- 2002028276 subject "502/.8/25 21".
- 2002028276 subject "QH212.S3 S29 2003".
- 2002028276 subject "Scanning electron microscopy.".
- 2002028276 subject "X-ray microanalysis.".
- 2002028276 title "Scanning electron microscopy and x-ray microanalysis / Joseph I. Goldstein ... [et al.].".
- 2002028276 type "text".