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- 2002030050 contributor B9223656.
- 2002030050 contributor B9223657.
- 2002030050 created "c2002.".
- 2002030050 date "2002".
- 2002030050 date "c2002.".
- 2002030050 dateCopyrighted "c2002.".
- 2002030050 description "Includes bibliographical references and index.".
- 2002030050 extent "xiv, 204 p. :".
- 2002030050 identifier "1402070764 (alk. paper)".
- 2002030050 identifier 2002030050-d.html.
- 2002030050 identifier 2002030050-t.html.
- 2002030050 issued "2002".
- 2002030050 issued "c2002.".
- 2002030050 language "eng".
- 2002030050 publisher "Boston : Kluwer Academic Publishers,".
- 2002030050 subject "621.3815/028/7 21".
- 2002030050 subject "Integrated circuits Testing.".
- 2002030050 subject "Integrated circuits Thermal properties.".
- 2002030050 subject "TK7874 .A44 2002".
- 2002030050 subject "Temperature measurements.".
- 2002030050 title "Thermal testing of integrated circuits / by Josep Altet and Antonio Rubio.".
- 2002030050 type "text".