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- 2002030612 contributor B9224314.
- 2002030612 created "c2003.".
- 2002030612 date "2003".
- 2002030612 date "c2003.".
- 2002030612 dateCopyrighted "c2003.".
- 2002030612 description "Includes bibliographical references and index.".
- 2002030612 extent "xiv, 440 p. :".
- 2002030612 identifier "3540418180 (alk. paper)".
- 2002030612 identifier 2002030612-d.html.
- 2002030612 identifier 2002030612-t.html.
- 2002030612 isPartOf "Springer series in materials science ; v. 50.".
- 2002030612 isPartOf "Springer series in materials science, 0933-033X ; 50".
- 2002030612 issued "2003".
- 2002030612 issued "c2003.".
- 2002030612 language "eng".
- 2002030612 publisher "Berlin ; New York : Springer,".
- 2002030612 subject "620.1/1299 21".
- 2002030612 subject "Materials Microscopy.".
- 2002030612 subject "TA417.23 .H534 2003".
- 2002030612 subject "Transmission electron microscopy.".
- 2002030612 title "High-resolution imaging and spectrometry of materials / F. Ernst, M. Rühle (eds.).".
- 2002030612 type "text".