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- 2002034049 contributor B9227653.
- 2002034049 created "c2003.".
- 2002034049 date "2003".
- 2002034049 date "c2003.".
- 2002034049 dateCopyrighted "c2003.".
- 2002034049 description "Includes bibliographical references (p. [229]-239) and index.".
- 2002034049 extent "xiii, 246 p. :".
- 2002034049 identifier "1402072554 (alk. paper)".
- 2002034049 identifier 2002034049-d.html.
- 2002034049 identifier 2002034049-t.html.
- 2002034049 isPartOf "Frontiers in electronic testing".
- 2002034049 issued "2003".
- 2002034049 issued "c2003.".
- 2002034049 language "eng".
- 2002034049 publisher "Boston : Kluwer Academic,".
- 2002034049 subject "621.39/732 21".
- 2002034049 subject "Computer storage devices Testing.".
- 2002034049 subject "Semiconductor storage devices Testing.".
- 2002034049 subject "TK7895.M4 A27 2003".
- 2002034049 title "High performance memory testing : design principles, fault modeling, and self-test / R. Dean Adams.".
- 2002034049 type "text".