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- 2002070720 contributor B9241040.
- 2002070720 contributor B9241041.
- 2002070720 created "c2002.".
- 2002070720 date "2002".
- 2002070720 date "c2002.".
- 2002070720 dateCopyrighted "c2002.".
- 2002070720 description "Includes bibliographical references and index.".
- 2002070720 extent "xxi, 748 p. :".
- 2002070720 identifier "3540437649 (alk. paper)".
- 2002070720 identifier 2002070720-d.html.
- 2002070720 identifier 2002070720-t.html.
- 2002070720 issued "2002".
- 2002070720 issued "c2002.".
- 2002070720 language "eng".
- 2002070720 publisher "Berlin ; New York : Springer,".
- 2002070720 subject "620.1/1299 21".
- 2002070720 subject "Materials Microscopy.".
- 2002070720 subject "TA417.23 .F85 2002".
- 2002070720 subject "Transmission electron microscopy.".
- 2002070720 subject "X-ray diffractometer.".
- 2002070720 title "Transmission electron microscopy and diffractometry of materials / Brent Fultz, James Howe.".
- 2002070720 type "text".