Matches in Library of Congress for { <http://lccn.loc.gov/2002100970> ?p ?o. }
Showing items 1 to 19 of
19
with 100 items per page.
- 2002100970 contributor B9249311.
- 2002100970 contributor B9249312.
- 2002100970 created "c2002.".
- 2002100970 date "2002".
- 2002100970 date "c2002.".
- 2002100970 dateCopyrighted "c2002.".
- 2002100970 extent "258 p. :".
- 2002100970 identifier "0780374169".
- 2002100970 identifier 2002100970.html.
- 2002100970 issued "2002".
- 2002100970 issued "c2002.".
- 2002100970 language "eng".
- 2002100970 publisher "Piscataway, NJ : IEEE,".
- 2002100970 subject "621.3815 22".
- 2002100970 subject "Integrated circuits Defects Congresses.".
- 2002100970 subject "Integrated circuits Testing Congresses.".
- 2002100970 subject "TK7874 .I47377 2002".
- 2002100970 title "Proceedings of the 9th International Symposium on the Physical & Failure Analysis of Integrated Circuits, IPFA 2002 / edited by John Thong ... [et al.] ; organised by IEEE Reliability/CPM/ED Singapore Chapter; technically co-sponored by IEEE Electron Devices Society, IEEE Reliability Society in co-operation with Centre for IC Failure Analysis & Reliability, National University of Singapore.".
- 2002100970 type "text".