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- 2002102851 contributor B9250790.
- 2002102851 contributor B9250791.
- 2002102851 created "2002.".
- 2002102851 date "2002".
- 2002102851 date "2002.".
- 2002102851 dateCopyrighted "2002.".
- 2002102851 description "Includes bibliographical references and indexes.".
- 2002102851 extent "ix, 250 p. :".
- 2002102851 identifier "073540058X".
- 2002102851 identifier 2002102851-d.html.
- 2002102851 identifier 2002102851.html.
- 2002102851 isPartOf "AIP conference proceedings ; no. 612.".
- 2002102851 isPartOf "AIP conference proceedings, 0094-243X ; v. 612".
- 2002102851 issued "2002".
- 2002102851 issued "2002.".
- 2002102851 language "eng".
- 2002102851 publisher "Melville, NY : American Institute of Physics,".
- 2002102851 subject "621.3815/2 22".
- 2002102851 subject "Electrodiffusion Congresses.".
- 2002102851 subject "Integrated circuits Defects Congresses.".
- 2002102851 subject "TK7871.85 .S773 2001".
- 2002102851 subject "Thin film devices Defects Congresses.".
- 2002102851 title "Stress-induced phenomena in metallization : Sixth International Workshop on Stress-Induced Phenomena in Metallization, Ithaca, New York, 25-27 July 2001 / editors, Shefford P. Baker ... [et al.].".
- 2002102851 type "text".