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- 2002115581 alternative "IPFA 2003".
- 2002115581 alternative "Physical & failure analysis of integrated circuits".
- 2002115581 contributor B9260441.
- 2002115581 contributor B9260442.
- 2002115581 contributor B9260443.
- 2002115581 created "c2003.".
- 2002115581 date "2003".
- 2002115581 date "c2003.".
- 2002115581 dateCopyrighted "c2003.".
- 2002115581 description "Includes bibliographic references and author index.".
- 2002115581 extent "[ix], [220] p. :".
- 2002115581 hasFormat "Also available via the World Wide Web.".
- 2002115581 identifier "0780377222".
- 2002115581 isFormatOf "Also available via the World Wide Web.".
- 2002115581 issued "2003".
- 2002115581 issued "c2003.".
- 2002115581 language "eng".
- 2002115581 publisher "Piscataway, New Jersey. : IEEE,".
- 2002115581 relation "Also available via the World Wide Web.".
- 2002115581 subject "621.3815 22".
- 2002115581 subject "Integrated circuits Defects Congresses.".
- 2002115581 subject "Integrated circuits Testing Congresses.".
- 2002115581 subject "TK7874 .I47377 2003".
- 2002115581 title "IPFA 2003".
- 2002115581 title "Physical & failure analysis of integrated circuits".
- 2002115581 title "Proceedings of the 10th International Symposium on the Physical & Failure Analysis of Integrated Circuits : IPFA 2003 : [scheduled, 7 to 11 July, 2003, Singapore] / edited by Philip Ho ... [et al.] ; organised by IEEE Reliability/CPMT/ED Singapore Chapter ; technically co-sponsored by IEEE Electron Devices Society, IEEE Reliability Society ; in cooperation with Centre for IC Failure Analysis & Reliability, National University of Singapore.".
- 2002115581 type "text".