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- 2002153114 contributor B9264819.
- 2002153114 contributor B9264820.
- 2002153114 created "c2003.".
- 2002153114 date "2003".
- 2002153114 date "c2003.".
- 2002153114 dateCopyrighted "c2003.".
- 2002153114 description "Includes bibliographical references (p. [195]-202) and index.".
- 2002153114 extent "x, 212 p. :".
- 2002153114 identifier "0470847123 (cloth : alk. paper)".
- 2002153114 identifier "0470847131 (pbk. : alk. paper)".
- 2002153114 identifier 2002153114.html.
- 2002153114 identifier 2002153114.html.
- 2002153114 identifier 2002153114.html.
- 2002153114 issued "2003".
- 2002153114 issued "c2003.".
- 2002153114 language "eng".
- 2002153114 publisher "Chichester, West Sussex, England ; New York : J. Wiley,".
- 2002153114 subject "620/.44 21".
- 2002153114 subject "Electron spectroscopy.".
- 2002153114 subject "Surfaces (Technology) Analysis.".
- 2002153114 subject "TP156.S95 W373 2003".
- 2002153114 title "An introduction to surface analysis by XPS and AES / John F. Watts, John Wolstenholme.".
- 2002153114 type "text".