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- 2002265281 contributor B9271061.
- 2002265281 contributor B9271062.
- 2002265281 created "c2001.".
- 2002265281 date "2001".
- 2002265281 date "c2001.".
- 2002265281 dateCopyrighted "c2001.".
- 2002265281 description "Includes bibliographic references and author index.".
- 2002265281 extent "ix, 304 p. :".
- 2002265281 identifier "0819440930".
- 2002265281 isPartOf "Proceedings of SPIE / SPIE--the International Society for Optical Engineering, 0277-786X ; v. 4398".
- 2002265281 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4398.".
- 2002265281 issued "2001".
- 2002265281 issued "c2001.".
- 2002265281 language "eng".
- 2002265281 publisher "Bellingham, Washington : SPIE,".
- 2002265281 subject "670.42/5 21".
- 2002265281 subject "Optical detectors Industrial applications Congresses.".
- 2002265281 subject "Optical instruments Industrial applications Congresses.".
- 2002265281 subject "Quality control Optical methods Congresses.".
- 2002265281 subject "TS156.2 .O654 2001".
- 2002265281 title "Optical measurement systems for industrial inspection II : application in industrial design : 18-19 June, 2001, Munich, Germany / Wolfgang Osten, Werner P.O. Jüptner, Malgorzata Kujawińska, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering ; cosponsored by European Optical Society, WLT--Wissenschaftliche Gesellschaft Lasertechnik e.V. (Germany).".
- 2002265281 type "text".