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- 2002276471 contributor B9273667.
- 2002276471 contributor B9273668.
- 2002276471 created "c2000.".
- 2002276471 date "2000".
- 2002276471 date "c2000.".
- 2002276471 dateCopyrighted "c2000.".
- 2002276471 description "Includes bibliographical references.".
- 2002276471 extent "vii, 224 p. :".
- 2002276471 hasFormat "Also available via the World Wide Web with additional title: GaAs Reliability Workshop, 2000, proceedings.".
- 2002276471 identifier "0780350677 (microfiche)".
- 2002276471 identifier "0790801027 (softbound)".
- 2002276471 identifier RecentCon.htm?punumber=7233.
- 2002276471 isFormatOf "Also available via the World Wide Web with additional title: GaAs Reliability Workshop, 2000, proceedings.".
- 2002276471 issued "2000".
- 2002276471 issued "c2000.".
- 2002276471 language "eng".
- 2002276471 publisher "Piscataway, N.J. : IEEE,".
- 2002276471 relation "Also available via the World Wide Web with additional title: GaAs Reliability Workshop, 2000, proceedings.".
- 2002276471 subject "621.3815/2 21".
- 2002276471 subject "Gallium arsenide semiconductors Congresses.".
- 2002276471 subject "Semiconductors Materials Congresses.".
- 2002276471 subject "Semiconductors Reliability Congresses.".
- 2002276471 subject "TK7871.15.G3 G32 2000".
- 2002276471 title "2000 GaAs Reliability Workshop : proceedings : November 5, 2000, Seattle, Washington / sponsored by JEDEC JC-14.7 Committee on GaAs Reliability and Quality Standards ; with technical co-sponsorship of the Electron Devices Society of the Institute of Electrical and Electronics Engineers, Inc.".
- 2002276471 type "text".