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- 2002280327 contributor B9278429.
- 2002280327 created "c2002.".
- 2002280327 date "2002".
- 2002280327 date "c2002.".
- 2002280327 dateCopyrighted "c2002.".
- 2002280327 description "Includes bibliographical references (p. 303-324) and index.".
- 2002280327 extent "xvii, 336 p. :".
- 2002280327 identifier "3527304584 (acid-free paper)".
- 2002280327 identifier 2002280327.html.
- 2002280327 identifier 2002280327.html.
- 2002280327 issued "2002".
- 2002280327 issued "c2002.".
- 2002280327 language "eng".
- 2002280327 publisher "Weinheim : Wiley-VCH,".
- 2002280327 subject "620/.44 21".
- 2002280327 subject "Electron spectroscopy.".
- 2002280327 subject "QC176.84.S93 S87 2002".
- 2002280327 subject "Spectrum analysis.".
- 2002280327 subject "Thin films Surfaces Analysis.".
- 2002280327 title "Surface and thin film analysis : principles, instrumentation, applications / edited by H. Bubert and H. Jenett.".
- 2002280327 type "text".