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- 2002283059 contributor B9281718.
- 2002283059 contributor B9281719.
- 2002283059 created "c2002.".
- 2002283059 date "2002".
- 2002283059 date "c2002.".
- 2002283059 dateCopyrighted "c2002.".
- 2002283059 description "Includes bibliographic references and author index.".
- 2002283059 extent "ix, 236 p. :".
- 2002283059 identifier "081944295X".
- 2002283059 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4567.".
- 2002283059 isPartOf "SPIE proceedings series ; v. 4567".
- 2002283059 issued "2002".
- 2002283059 issued "c2002.".
- 2002283059 language "eng".
- 2002283059 publisher "Bellingham, Washington : SPIE,".
- 2002283059 subject "681/.25 21".
- 2002283059 subject "Computer vision Congresses.".
- 2002283059 subject "Computer vision Industrial applications Congresses.".
- 2002283059 subject "Metrology Congresses.".
- 2002283059 subject "Quality control Optical methods Congresses.".
- 2002283059 subject "TA1634 .M316 2002".
- 2002283059 subject "Three-dimensional display systems Congresses.".
- 2002283059 title "Machine vision and three-dimensional imaging systems for inspection and metrology II : 29-30 October 2001, Boston, [Massachusetts] USA / Kevin G. Harding, John W.V. Miller, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- 2002283059 type "text".