Matches in Library of Congress for { <http://lccn.loc.gov/2002726813> ?p ?o. }
Showing items 1 to 25 of
25
with 100 items per page.
- 2002726813 contributor B9495617.
- 2002726813 contributor B9495618.
- 2002726813 created "c2002.".
- 2002726813 date "2002".
- 2002726813 date "c2002.".
- 2002726813 dateCopyrighted "c2002.".
- 2002726813 description "Includes bibliographical references and index.".
- 2002726813 extent "ix, 228 p. :".
- 2002726813 identifier "0819444510".
- 2002726813 isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4703.".
- 2002726813 isPartOf "SPIE proceedings series, 0277-786X ; v. 4703".
- 2002726813 issued "2002".
- 2002726813 issued "c2002.".
- 2002726813 language "eng".
- 2002726813 publisher "Bellingham, Wash., USA : SPIE,".
- 2002726813 subject "620/.5 22".
- 2002726813 subject "Microelectromechanical systems Evaluation.".
- 2002726813 subject "Microelectromechanical systems Reliability.".
- 2002726813 subject "Nanostructured materials Testing Congresses.".
- 2002726813 subject "Nondestructive testing Congresses.".
- 2002726813 subject "Quality control Congresses.".
- 2002726813 subject "Surfaces (Technology) Congresses.".
- 2002726813 subject "TA418.9.N35 N66 2002".
- 2002726813 title "Nondestructive evaluation and reliability of micro- and nanomaterial systems : 18-19 March 2002, Newport Beach, USA / Norbert Meyendorf, George Y. Baaklini, Bernd Michel, chairs/editors ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- 2002726813 type "text".