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- 2003019970 contributor B9519738.
- 2003019970 contributor B9519739.
- 2003019970 created "c2004.".
- 2003019970 date "2004".
- 2003019970 date "c2004.".
- 2003019970 dateCopyrighted "c2004.".
- 2003019970 description "Includes bibliographical references (p. 209-210) and index.".
- 2003019970 extent "xix, 218 p. :".
- 2003019970 identifier "0814407927".
- 2003019970 identifier 2003019970.html.
- 2003019970 issued "2004".
- 2003019970 issued "c2004.".
- 2003019970 language "eng".
- 2003019970 publisher "New York : American Management Association,".
- 2003019970 subject "620/.00452 22".
- 2003019970 subject "Reliability (Engineering)".
- 2003019970 subject "TA169 .B48 2004".
- 2003019970 title "World class reliability : using Multiple Environment Overstress Tests to make it happen / Keki R. Bhote and Adi K. Bhote.".
- 2003019970 type "text".