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- 2003041573 contributor B9531217.
- 2003041573 created "c2003.".
- 2003041573 date "2003".
- 2003041573 date "c2003.".
- 2003041573 dateCopyrighted "c2003.".
- 2003041573 description "Includes bibliographical references and index.".
- 2003041573 extent "xii, 238 p. :".
- 2003041573 identifier "3540004149 (alk. paper)".
- 2003041573 isPartOf "Springer tracts in modern physics ; 182".
- 2003041573 issued "2003".
- 2003041573 issued "c2003.".
- 2003041573 language "eng".
- 2003041573 publisher "Berlin ; New York : Springer,".
- 2003041573 subject "621.3815/2 21".
- 2003041573 subject "QD139.S34 R67 2003".
- 2003041573 subject "Semiconductors Analysis.".
- 2003041573 subject "Semiconductors Microscopy.".
- 2003041573 subject "Transmission electron microscopy.".
- 2003041573 title "Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state / Andreas Rosenauer.".
- 2003041573 type "text".