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- 2003042481 contributor B9532202.
- 2003042481 contributor B9532203.
- 2003042481 created "c2003.".
- 2003042481 date "2003".
- 2003042481 date "c2003.".
- 2003042481 dateCopyrighted "c2003.".
- 2003042481 description "Includes bibliographical references (p. [173]-179) and index.".
- 2003042481 extent "viii, 193 p. :".
- 2003042481 identifier "3540434399 (alk. paper)".
- 2003042481 identifier 2003042481-d.html.
- 2003042481 identifier 2003042481-t.html.
- 2003042481 isPartOf "Springer series in advanced microelectronics".
- 2003042481 issued "2003".
- 2003042481 issued "c2003.".
- 2003042481 language "eng".
- 2003042481 publisher "New York : Springer,".
- 2003042481 subject "621.3815/48 21".
- 2003042481 subject "Electronic apparatus and appliances Testing.".
- 2003042481 subject "Electronic apparatus and appliances Thermal properties.".
- 2003042481 subject "Semiconductors Thermal properties.".
- 2003042481 subject "TK7870.25 .B74 2003".
- 2003042481 subject "Thermography.".
- 2003042481 title "Lock-in thermography : basics and use for functional diagnostics of electronic components / O. Breitenstein, M. Langenkamp.".
- 2003042481 type "text".