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- 2003059049 contributor B9550281.
- 2003059049 created "c2004.".
- 2003059049 date "2004".
- 2003059049 date "c2004.".
- 2003059049 dateCopyrighted "c2004.".
- 2003059049 description "Includes bibliographical references and index.".
- 2003059049 extent "xx, 496 p. :".
- 2003059049 identifier "3540005277 (alk. paper)".
- 2003059049 identifier 2003059049-d.html.
- 2003059049 identifier 2003059049-t.html.
- 2003059049 isPartOf "Nanoscience and technology".
- 2003059049 issued "2004".
- 2003059049 issued "c2004.".
- 2003059049 language "eng".
- 2003059049 publisher "Berlin ; New York : Springer,".
- 2003059049 subject "620.1/1299 22".
- 2003059049 subject "Materials Microscopy.".
- 2003059049 subject "Scanning probe microscopy.".
- 2003059049 subject "TA417.23 .A655 2004".
- 2003059049 title "Applied scanning probe methods / Bharat Bhushan, Harald Fuchs, Sumio Hosaka [eds.].".
- 2003059049 type "text".