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- 2003061871 contributor B9553150.
- 2003061871 created "c2003.".
- 2003061871 date "2003".
- 2003061871 date "c2003.".
- 2003061871 dateCopyrighted "c2003.".
- 2003061871 description "Includes bibliographical references (p. [231]-241).".
- 2003061871 extent "xiv, 241 p. :".
- 2003061871 identifier "1402075898 (alk. paper)".
- 2003061871 identifier 2003061871-d.html.
- 2003061871 identifier 2003061871-t.html.
- 2003061871 isPartOf "Frontiers in electronic testing ; 23".
- 2003061871 issued "2003".
- 2003061871 issued "c2003.".
- 2003061871 language "eng".
- 2003061871 publisher "Boston : Kluwer Academic Publishers,".
- 2003061871 subject "004.2/56 22".
- 2003061871 subject "Embedded computer systems Reliability.".
- 2003061871 subject "Embedded computer systems Testing.".
- 2003061871 subject "Fault location (Engineering)".
- 2003061871 subject "TK7895.E42 F38 2003".
- 2003061871 title "Fault injection techniques and tools for embedded systems reliability evaluation / edited by Alfredo Benso and Paolo Prinetto.".
- 2003061871 type "text".