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- 2003063488 contributor B9554838.
- 2003063488 contributor B9554839.
- 2003063488 created "2004.".
- 2003063488 date "2004".
- 2003063488 date "2004.".
- 2003063488 dateCopyrighted "2004.".
- 2003063488 description "Includes bibliographical references (p. 447-451) and index.".
- 2003063488 extent "xviii, 460 p. :".
- 2003063488 identifier "047143308X (cloth)".
- 2003063488 identifier 2003063488.html.
- 2003063488 identifier 2003063488.html.
- 2003063488 identifier 2003063488.html.
- 2003063488 issued "2004".
- 2003063488 issued "2004.".
- 2003063488 language "eng".
- 2003063488 publisher "Hoboken, NJ : John Wiley,".
- 2003063488 subject "621.382/24 22".
- 2003063488 subject "Electromagnetic compatibility.".
- 2003063488 subject "Electromagnetic interference.".
- 2003063488 subject "TK7867.2 M66 2004".
- 2003063488 title "Testing for EMC compliance : approaches and techniques / Mark I. Montrose, Edward M. Nakauchi.".
- 2003063488 type "text".