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- 2003277476 contributor B9592838.
- 2003277476 contributor B9592839.
- 2003277476 created "2003.".
- 2003277476 date "2003".
- 2003277476 date "2003.".
- 2003277476 dateCopyrighted "2003.".
- 2003277476 description "Includes bibliographical references and index.".
- 2003277476 extent "xvi, 1000 p. :".
- 2003277476 identifier "0521773563".
- 2003277476 identifier 2003277476.html.
- 2003277476 identifier 2003277476-b.html.
- 2003277476 identifier 2003277476.html.
- 2003277476 identifier 2003277476.html.
- 2003277476 issued "2003".
- 2003277476 issued "2003.".
- 2003277476 language "eng".
- 2003277476 publisher "Cambridge : Cambridge University Press,".
- 2003277476 subject "621.381548 21".
- 2003277476 subject "Digital integrated circuits Testing.".
- 2003277476 subject "TK7874.65 .J43 2003".
- 2003277476 title "Testing of digital systems / N.K. Jha and S. Gupta.".
- 2003277476 type "text".